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Residual Stress, Mechanical Behavior and Electrical Properties of Cu/Nb Thin-Film Multilayers

Author(s):
Griffin, A. J., Jr.
Embury, J. D.
Hundley, M. F.
Jervis, T. R.
Kung, H. H.
Scarborough, W. K.
Walter, K. C.
Wood, J.
Nastasi, M.
4 more
Publication title:
Structure and properties of multilayered thin films : symposium held April 17-19, 1995, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
382
Pub. Year:
1995
Page(from):
309
Pub. info.:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992856 [1558992855]
Language:
English
Call no.:
M23500/382
Type:
Conference Proceedings

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