Blank Cover Image

Amorphous Semiconductor Sample Preparation for Transmission EXAFS Measurements

Author(s):
Ridgway, M. C.
Glover, C. J.
Tan, H. H.
Clark, A.
Karouta, F.
Foran, G. J.
Lee, T. W.
Moon, Y.
Yoon, E.
Hansen, J. L.
Nylandsted-Larsen, A.
Clerc, C.
Chaumont, J.
8 more
Publication title:
Applications of synchrotron radiation techniques to materials science IV : sympoisum held April 13-17, 1998, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
524
Pub. Year:
1998
Page(from):
309
Pub. info.:
Warrendale, Penn.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558994300 [1558994300]
Language:
English
Call no.:
M23500/524
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings EXAFS Characterization of Amorphous GaAs

Ridgway, M. C., Glover, C. J., Foran, G. J., Yu, K. M.

MRS - Materials Research Society
7 Conference Proceedings Applications of M6ssbauer Spectroscopy to Investigations of Defects in Semiconductors

Larsen,A.Nylandsted, Petersen,J.W., Weyer,G.

Trans Tech Publications
2 Conference Proceedings In Situ Transmission Electron Microscopy of the Solid-Phase Epitaxial Growth of GaAs: Sample Preparation and Artifact Characterization

Llewellyn, D. J., Belay, K. B., Ridgway, M. C.

MRS - Materials Research Society
8 Conference Proceedings Piezoresistance in Strained Silicon and Strained Silicon Germanium

J. Richter, M. B. Arnoldus, J. Lundsgaard Hansen, A. Nylandsted Larsen, O. Hansen, E. V. Thomsen

Materials Research Society
3 Conference Proceedings ERBIUM DOPING OF SILICON AND SILICON CARBIDE USING ION BEAM INDUCED EPITAXIAL CRYSTALLIZATION

Boucaud, P., Julien, F.-H., Lourtioz, J.-M., Bernas, H., Clerc, C., Chaumont, J., Bodnar, S., Regolini, J.-L., Lin, X. …

MRS - Materials Research Society
9 Conference Proceedings Interface Characterization in the Semiconductor Industry

A. C. Diebold, P. Y. Hung, J. Price, B. Foran, H. Celio, T. Kelly

Electrochemical Society
4 Conference Proceedings PECULIARITIES IN THE EPITAXIAL REGROWTH OF ION-IMPLANTED Si1-xGex ALLOY LAYERS GROWN ON COMPOSITIONALLY GRADED BUFFERS

Fyhn, M., Shiryaev, S. Yu., Larsen, A. Nylandsted, Hansen, J. Lundsgaard

MRS - Materials Research Society
10 Conference Proceedings TRANSMISSION ELECTRON MICROSCOPY AND RESISTIVITY MEASUREMENTS ON Pdl-x Six ALLOYS PREPARED BY ION IMPLANTATION

Traverse, A., Ruault, M. O., Mendoza-Zelis, L., Schack, M., Bernas, H., Chaumont, J., Dumoulin, L.

North-Holland
5 Conference Proceedings Impurity Gettering in MBE Grown Silicon

Larsen, A. Nylandsted, Kringhoj, P., Hansen, J. Lundsgaard, Shiryaev, S. Yu.

MRS - Materials Research Society
11 Conference Proceedings Gallium K-edge EXAFS study of GaN:Mg films

Pan,Y.-C., Wang,S.-F., Lee,W.-H., Lin,W.-C., Shu,C.-K., Chiang,C.-I., Lin,C.-W., Chang,H., Lee,J.-F., Jang,L.-Y., …

SPIE - The International Society for Optical Engineering
6 Conference Proceedings ANNEALING OF METASTABLE RECOMBINATION CENTERS IN HYDROGENATED AMORPHOUS SILICON

Yoon, J.-H., Lee, Y.-Z.

Materials Research Society
12 Conference Proceedings Simultaneous Phosphorus and Si Self-Diffusion in Extrinsic, Isotopically Controlled Silicon Heterostructures

Silvestri, Hughes H., Bracht, Hartmut A., Sharp, Ian D., Hansen, John, Nylandsted-Larsen, Arne, Haller, Eugene E.

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12