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Chemical Analysis of Particles and Semiconductor Microstructures by Synchrotron Radiation Soft X-ray Photoemission Spectromicroscopy

Author(s):
Gozzo, F.
Triplett, B.
Fujimoto, H.
Ynzunza, R.
Coon, P.
Ayre, C.
Kinney, P. D.
Uritsky, Y. S.
Ackermann, G.
Johnson, A.
Padmore, H.
Renner, T.
Sheridan, B.
Steele, W.
Hussain, Z.
10 more
Publication title:
Applications of synchrotron radiation techniques to materials science IV : sympoisum held April 13-17, 1998, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
524
Pub. Year:
1998
Page(from):
227
Pub. info.:
Warrendale, Penn.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558994300 [1558994300]
Language:
English
Call no.:
M23500/524
Type:
Conference Proceedings

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