Crystallographic Analysis of CVD Films by Using X-ray Polychromatic Radiation
- Author(s):
- Publication title:
- Applications of synchrotron radiation techniques to materials science IV : sympoisum held April 13-17, 1998, San Francisco, California, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 524
- Pub. Year:
- 1998
- Page(from):
- 121
- Pub. info.:
- Warrendale, Penn.: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558994300 [1558994300]
- Language:
- English
- Call no.:
- M23500/524
- Type:
- Conference Proceedings
Similar Items:
Electrochemical Society |
SPIE-The International Society for Optical Engineering |
Electrochemical Society |
Electrochemical Society |
MRS - Materials Research Society |
9
Conference Proceedings
Evaluation of Residual Stresses Near a Welded Zone by Transmission Energy Dispersive X-Ray Diffraction
Trans Tech Publications |
4
Conference Proceedings
Stress Evaluation by Transmission Energy Dispersive X-Ray Diffraction Using Industrial Radiography Equipment
Trans Tech Publications |
Electrochemical Society |
5
Conference Proceedings
X-ray Residual Stress Measurement in Films with Crystallographic Texture and Grain Shape
MRS - Materials Research Society |
11
Conference Proceedings
Extensions of Electron Diffraction Based Techniques in Crystallographic Characterization
Trans Tech Publications |
Society of Photo-optical Instrumentation Engineers |
12
Conference Proceedings
Modelisation of Strains Measured by X-Ray Diffraction in Composites with Spherical Particles
Trans Tech Publications |