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In Situ Real-Time Spectroscopic Ellipsometry Applied to the Surface Monitoring of Semiconductors

Author(s):
Publication title:
Advances in microcrystalline and nanocrystalline semiconductors, 1996 : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
452
Pub. Year:
1997
Page(from):
1025
Pub. info.:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558993563 [1558993568]
Language:
English
Call no.:
M23500/452
Type:
Conference Proceedings

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