Surface characterization of an XMM mandrel at the European Synchrotron Radiation Facility:part II

Surface characterization of an XMM mandrel at the European Synchrotron Radiation Facility:part II

Author(s):

Gougeon,S. ( European Synchrotron Radiation Facility )

Publication title:

Multilayer and grazing incidence X-ray/EUV optics III : 5-6 August, 1996, Denver, Colorado

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2805

Pub. Year:

1996

Page(from):

90

Page(to):

107

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819421937 [0819421936]

Language:

English

Call no.:

P63600/2805

Type:

Conference Proceedings

Details

TDL ID:	ZA00018876
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Multilayer and Grazing Incidence X-Ray/Euv Optics
Conf. info. (Number):	1996 : 3rd
Conf. info. (Venue):	Denver, CO, USA
Conf. info. (Date):	1996.08.05-1996.08.06

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