Blank Cover Image

Recombination centers in electron irradiated Si and GaAs

Author(s):
Publication title:
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997
Title of ser.:
Materials science forum
Ser. no.:
258-263
Pub. Year:
1997
Vol.:
Part1
Page(from):
629
Page(to):
634
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497874 [0878497870]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Defects in Electron Irradiated GaP and GaInP

Zaidi,M.A., Maaref,H., Zazoui,M., Bourgoin,J.C.

Trans Tech Publications
7 Conference Proceedings Detection and identification of the EL2 metastable state in GaAs

Bourgoin,J.C.

Trans Tech Publications
2 Conference Proceedings Irradiation Induced Recombination Centers in GaAs Solar Cells

Bourgoin, J.C., de Angelis, N.

ESA Publications Division
8 Conference Proceedings Electron Transport Through Semiconductor Barriers

Bourgoin,J.C.

SPIE-The International Society for Optical Engineering, Narosa
3 Conference Proceedings CORRELATION OF THE 0.8 Ev EMISSION BAND WITH THE EL6 CENTER IN GaAs

Alaya, S., Zaidi, M.A., Marrakchi, G., Maaref, H., von Bardeleben, H.J., Bourgoin, J.C.

Materials Research Society
9 Conference Proceedings Electrical properties of low temperature grown GaAs

Stellmacher,M., Nagle,J., Khirouni,K., Bourgoin,J.C.

Trans Tech Publications
4 Conference Proceedings Mechanism of Irradiation Induced Degradation of Solar Cells

Zazoui, M., Zin Aldin, A., Mbarki, M., Bourgoin, J.C.

ESA Publications Division
10 Conference Proceedings CHARACTERIZATION OF ELECTRON TRAPS IN GaAs-GaAlAs SUPERLATTICES.

SILLION,F., MAUGER,A., BOURGOIN,J.C., DEVFAUD,B., REGRENY,A., STIEVENARD,D.

Trans Tech Publications
5 Conference Proceedings ELECTRIC FIELD ENHANCEMENT OF ELECTRON EMISSION FROM DX CENTERS AND CONSEQUENCES

Bourgoin, J.C., Zazoui, M., Feng, S.L., von Bardeleben, H.J., Alaya, S., Maaref, H.

Materials Research Society
11 Conference Proceedings Defects in thick epitaxial GaAs layers

Samic,H., Bourgoin,J.C.

Trans Tech Publications
6 Conference Proceedings Detection Of Defects Responsible for Lifetime in p-Type Si

Zazoui,M., Bourgoin,J.C., Stievenard,D., Deresmes,D.

Trans Tech Publications
12 Conference Proceedings Defect Induced Electron Transport through Semiconductor Barriers

Bourgoin,J.C., Mir,L.El

Trans Tech Publications
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12