Identification of VH in silicon by EPR

Author(s):

• Johannesen,P.
• Byberg,J.R.
• Nielsen,B.Bech
• Stallinga,P.
• Nielsen,K.Bonde

Publication title:

Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997

Title of ser.:

Materials science forum

Ser. no.:

258-263

Pub. Year:

1997

Vol.:

Part1

Page(from):

515

Page(to):

520

Pub. info.:

Zurich, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878497874 [0878497870]

Language:

English

Call no.:

M23650

Type:

Conference Proceedings