Blank Cover Image

The identification of the Si:Au and Si:Pt IS3/2(r8)+ヲ」phonon-assisted Fano resonance

Author(s):
Publication title:
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997
Title of ser.:
Materials science forum
Ser. no.:
258-263
Pub. Year:
1997
Vol.:
Part1
Page(from):
479
Page(to):
484
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497874 [0878497870]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings The orthorhombic FeIn complex in silicon

Tidlund,P., Kleverman,M.

Trans Tech Publications

7 Conference Proceedings Photothermal Ionization Spectroscopy

Grimmeiss,H.G., Kleverman,M., Olajos,J.

Trans Tech Publications

Olajos,J., Nielsen,B.Bech, Kleverman,M., Omling,P., Emanuelsson,O., Grimmeiss,H.G.

Trans Tech Publications

Nibbelke, R. H., Kreijveld, R. J. M., Hoebink, J. H. B. J., Marin, G. B.

Elsevier

3 Conference Proceedings Impurities in Semiconductors

Grimmeiss G. H., Kleverman M., Olajos J.omling P., Nagesh V.

Plenum Press

Z. Qiang, W. Zhou, M. Lu, G. J. Brown

Society of Photo-optical Instrumentation Engineers

Xu S. J., Xiong S.-J., Shi S. L., Jin K.-J.

SPIE - The International Society of Optical Engineering

Chandra,S., Wager,M.E., Clayton,B., Geiser,A.G., Allik,T.H., Ahl,J.L., Miller,C.R., Budni,P.A., Ketteridge,P.A., …

SPIE - The International Society for Optical Engineering

Grimmeiss, H.G., Kleverman, M., Olajos, J.

Materials Research Society

Lobo,R.P.S.M., Gotor,F.J., Odier,P., Gervais,F.

SPIE-The International Society for Optical Engineering

Kleverman, M., Olajos, J., Grossman, G., Grimmeiss, H. G.

Materials Research Society

Babcock,S.E., Yang,Ch.-Yu., Reeves,J.L., Wu,Yu., Pashitski,A.E., Polyanskii,A., Larbalestier,D.C., Goyal,A., …

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12