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Mossbauer spectroscopy of Fe in silicon with the novel Iaser-ionized 57Mn+ ion beam at ISOLDE

Author(s):
Weyer,G.
Degroote,S.
Fanciulli,M.
Fedoseyev,V.N.
Langouch,G.
Mishin,V.I.
Bavel,A.-M.Van
Vantomme,A.
Collaboration,the ISOLDE
4 more
Publication title:
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997
Title of ser.:
Materials science forum
Ser. no.:
258-263
Pub. Year:
1997
Vol.:
Part1
Page(from):
437
Page(to):
442
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497874 [0878497870]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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