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Iron in p-type silicon:A comprehensive model.(Invited)

Author(s):
Zhao,S.
Smith,A.L.
Ahn,S.H.
Norga,G.J.
Platero,M.T.
Nakashima,H.
Assali,L.V.C.
Michel,J.
Kimerling,L.C.
4 more
Publication title:
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997
Title of ser.:
Materials science forum
Ser. no.:
258-263
Pub. Year:
1997
Vol.:
Part1
Page(from):
429
Page(to):
436
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497874 [0878497870]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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