New opportunities in X-ray texture analysis of two phase Ti-aiuminides by application of a proportional scintillation detector and the component method to ODF reproduction

New opportunities in X-ray texture analysis of two phase Ti-aiuminides by application of a proportional scintillation detector and the component method to ODF reproduction

Author(s):

Publication title:

EPDIC 2 : proceedings of the Second European Powder Diffraction Conference, held, July 30 - August 1, 1992, in Enschede, The Netherlands

Title of ser.:

Materials science forum

Ser. no.:

133-136

Pub. Year:

1993

Vol.:

Pt.1

Page(from):

163

Page(to):

168

Pub. info.:

Aedermannsdorf, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878496617 [0878496610]

Language:

English

Call no.:

M23650

Type:

Conference Proceedings

Details

TDL ID:	ZA00018822
Series ID:	PA00000012
Conf. info. (Name):	European Powder Diffraction Conference
Conf. info. (Number):	2nd
Conf. info. (Venue):	Enschede, The Netherlands
Conf. info. (Date):	1992.07.30-1992.08.01

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