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Determination of the misfit and layer thickness of mono-crystalline epitaxial layers by means of high-resolution X-ray diffraction

Author(s):
Publication title:
EPDIC 1 : proceedings of the First European Powder Diffraction Conference held, March 14th - 16th, 1991. in Munich, Germany
Title of ser.:
Materials science forum
Ser. no.:
79-82
Pub. Year:
1991
Vol.:
Pt.1
Page(from):
165
Page(to):
168
Pub. info.:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878496341 [0878496343]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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