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The Vernier electronic readout - high resolution and image stability from a charge division readout for microchannel plates

Author(s):
Publication title:
EUV, x-ray, and gamma-ray instrumentation for astronomy IX : 22-24 July 1998 San Diego, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3445
Pub. Year:
1998
Page(from):
535
Page(to):
545
Pub. info.:
Bellingham, Wash.: SPIE
ISSN:
0277786X
ISBN:
9780819429001 [0819429007]
Language:
English
Call no.:
P63600/3445
Type:
Conference Proceedings

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