Blank Cover Image

Fault localisation for optical networks

Author(s):
Publication title:
All-optical networking : architecture, control, and management issues : 3-5 November 1998, Boston, Massachusetts
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3531
Pub. Year:
1998
Page(from):
408
Page(to):
419
Pub. info.:
Bellingham, Wash., USA: SPIE
ISSN:
0277786X
ISBN:
9780819429926 [0819429929]
Language:
English
Call no.:
P63600/3531
Type:
Conference Proceedings

Similar Items:

Drion, Christophe, Berthelon, Luc, Chambon, Olivier, Eilenberger, Gert, Peden, Francoise Roue, Jourdan, Amaury

SPIE

Francois Vaillant, Thierry Couvant, Jean-Marie Boursier, Claude Amzallag, Yves Rouillon, Olivier Raquet

American Society of Mechanical Engineers

Jean-Philippe Masse, Yves Bréchet, Luc Salvo, Olivier Bouaziz

Materials Research Society

Chriqui, Yves, Largeau, Ludovic, Patriarche, Gilles, Saint-Girons, Guillaume, Bouchoule, Sophie, Bensahel, Daniel, …

Materials Research Society

Mas, C., Tomkos, I., Tonguz, O. K.

SPIE-The International Society for Optical Engineering

Jean-Yves Camus

IOS Press

Edwards, E., Lamorie, J., St-Jean, E., Hartman, L.

ESA Publications Division

10 Conference Proceedings Linear Logic: A Survey

Girard Jean-Yves

Springr-Verlag

Baibarac, Michaela, Baltog, Ioan, Lefrant, Serge, Chauvet, Olivier, Mevellec, Jean-Yves, Vaccarini, Laetitia, Bernier, …

Materials Research Society

Chabre, Yves, Pannetier, Jean

MRS - Materials Research Society

Muriel Carin, Philippe Rogeon, Pierre-Yves Manach, Philippe Pilvin, Olivier Menes, Jean-Francois Sigrist

American Society of Mechanical Engineers

Le Gall, Jean-Yves

ESA Publications Division

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12