Rutt, U., Schneider, J.R., Beno, M.A., Knapp, G.S., Montano, P.A.
SPIE
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Ono, M., Mikula, P., Harjo, S., Saroun, J., Yoneda, K., Sawano, J., Sakurai, Y., Kobayashi, T.
Trans Tech Publications
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Knapp, G.S., Kurtz, C.A., Beno, M.A., Engbretson, M., Jennings, G.
SPIE
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Toda,N., Sumiya,H., Satoh,S., Ishikawa,T.
SPIE-The International Society for Optical Engineering
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Selinder, T. I., Miller, D. J., Gray, K. E., Beno, M. A., Knapp, G. S.
MRS - Materials Research Society
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Rutt, U., Stock, S.R., Rek, Z.U.
Materials Research Society
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Knapp, G. S., Beno, M. A., Jennings, G., Ramanathan, M.
MRS - Materials Research Society
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Erko,A.I., Schafers,F., Gudat,W., Sawhney,K.J., Abrosimov,N.V., Rossolenko,S.N., Alex,V., Groth,S., Schroder,S.W.
SPIE-The International Society for Optical Engineering
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Baumhacker, H., Pretzler, G., Witte, K.J, Hegelich, M., Kaluza, M., Karsch, S., Kudryashov, A.V., Samarkin, V.V., …
SPIE-The International Society for Optical Engineering
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Maser, J., Stephenson, G.B., Vogt, S., Yun, W., Macrander, A., Kang, H.C., Liu, C., Conley, R.
SPIE - The International Society of Optical Engineering
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Beno,M.A., Knapp,G.S., Engbretson,M., Jennings,G., Kurtz,C.A., Montano,P.A., Wiley,C.L.
SPIE-The International Society for Optical Engineering
|
Pivovaroff, M. J., Barber, W. B., Christensen, F. E., Craig, W. W., Decker, T., Epstein, M., Funk, T., Hailey, C., …
SPIE - The International Society of Optical Engineering
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