Optical sensor of a probing system for inspection of PCBs (Invited Paper)

Optical sensor of a probing system for inspection of PCBs (Invited Paper)

Author(s):

Shim,J.H. ( Korea Advanced Institute of Science and Technology )
Cho,H.S. ( Korea Advanced Institute of Science and Technology )
Kim,S. ( Samsung Electronics,Ltd. (Korea) )

Publication title:

Sensors and Controls for Advanced Manufacturing

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3201

Pub. Year:

1997

Page(from):

50

Page(to):

58

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819426338 [0819426334]

Language:

English

Call no.:

P63600/3201

Type:

Conference Proceedings

Details

TDL ID:	ZA00018790
Series ID:	PA00000029
Conf. info. (Name):	Intelligent Systems and Advanced Manufacturing : Sensors and Controls for Advanced Manufacturing:
Conf. info. (Number):	1997
Conf. info. (Venue):	Pittsburgh, PA, USA
Conf. info. (Date):	1997.10.14-1997.10.15

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