Blank Cover Image

Identification and Quantification of Trace Metal Impurities in Silicon Using the ELYMAT Lifetime Measurement

Author(s):
Gupta,D.C.  
Publication title:
Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3322
Pub. Year:
1997
Page(from):
267
Page(to):
279
Pub. info.:
Pennington, NJ: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819427656 [0819427659]
Language:
English
Call no.:
P63600/3322
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Identification and Quantification of Trace Metal Impurities in Silicon Using the ELYMAT Lifetime Measurement

Gupta, D.C.

Electrochemical Society
7 Conference Proceedings Luminescence Measurements of GaN Specimens with Various Impurities

Crisman, E.E., Roberts, C. B., Gregory, O.J., Morton, D.C.

Electrochemical Society
2 Conference Proceedings PHOTOLUMINESCENCE MEASUREMENTS OF TRACE AMOUNTS OF TRANSITION METAL IMPURITIES IN SILICON CRYSTAL

Nakamura, M., Suzuki, T.

Electrochemical Society
8 Conference Proceedings Structural Identification Using Inverse System Dynamics,#224

Kammer,D.C., Steltzner,AD.

SPIE - The International Society for Optical Engineering
3 Conference Proceedings Characterization of the Crystalline Quality of Silicon Layer in Bonded Silicon Material

Wijaranakula, W., Gupta, D.C.

Electrochemical Society
9 Conference Proceedings Laser Photoacoustic Spectroscopy-A Powerful Tool For Trace Gas Measurements,

Dumitras,D.C., Dutu,D.C.A., Cristescu,S., Mujat,C.

SPIE-The International Society for Optical Engineering
4 Conference Proceedings Transition-Metal Impurities Removal from Metallurgical Grade Silicon by Electron Beam Injection

R.X. Zou, D.C. Jiang, W. Dong, Z. Gu, Y. Tan

Trans Tech Publications
10 Conference Proceedings The Chemical Identification of Defect Impurities Using Radioactive Isotopes

Daly,S.E., Henry,M.O., Frehill,C.A., Freitag,K., Vianden,R., Rohrlack,G., Forkel,D.

Trans Tech Publications
5 Conference Proceedings Using infrared facial imagery for positive identification

D.C. Evans

Society of Photo-optical Instrumentation Engineers
11 Conference Proceedings IMPURITY DIFFUSION, CRYSTALLIZATION AND PHASE SEPARATION IN AMORPHOUS SILICON

Elliman, R.G., Poate, J.M., Williams, J.S., Gibson, J.M., Jacobson, D.C., Sood, D.K.

Materials Research Society
6 Conference Proceedings Characterizing Trace Metal Impurities in Optical-Waveguide Materials Using X-ray Absorption

Citrin, P. H., Northrup, P. A., Atkins, R. M., Glodis, P. F., Niu, L., Marcus, M. A., Jacobson, D. C.

MRS - Materials Research Society
12 Conference Proceedings Trace contaminants from photoresist materials by modern spectrometry determination

Ulieru,D.C.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12