X-Ray Microbeam Techniques and Applications*
- Author(s):
Isaacs,E.D. Evans-Lutterodt,K. Marcus,M.A. Macdowell,A.A. Lehnert,W. Vandenberg,J.M. Sputz,S. Johnson,J.E. Grenko,J. Ketelsen,L.J.P. Pinzone,C. Glew,R. Yun,W. Cai,Z. Rodrigues,W. Lee,H.-R. Lai,B. - Publication title:
- Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3322
- Pub. Year:
- 1997
- Page(from):
- 49
- Page(to):
- 59
- Pub. info.:
- Pennington, NJ: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819427656 [0819427659]
- Language:
- English
- Call no.:
- P63600/3322
- Type:
- Conference Proceedings
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