Texas echelon cross echelle spectrograph
- Author(s):
- Lacy,J.H. ( Univ.of Texas/Austin )
- Richter,M.J. ( Univ.of Texas/Austin )
- Yu,W. ( Univ.of Texas/Austin )
- Basso,B.S. ( Univ.of Texas/Austin )
- Publication title:
- Infrared astronomical instrumentation : 23-25 March 1998, Kona, Hawaii
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3354
- Pub. Year:
- 1998
- Vol.:
- Part 1
- Page(from):
- 436
- Page(to):
- 447
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819428011 [0819428019]
- Language:
- English
- Call no.:
- P63600/3354
- Type:
- Conference Proceedings
Similar Items:
SPIE-The International Society for Optical Engineering |
7
Conference Proceedings
Design of the TMT mid-infrared echelle: science drivers and design overview [6269-141]
SPIE - The International Society of Optical Engineering |
2
Conference Proceedings
Development and future use of the echelon-cross-echele spectrograph on SOFIA [6269-55]
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
4
Conference Proceedings
EXES:a progress report on the development of a high-resolution mid-infrared grating spectrograph for SOFIA
SPIE - The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
11
Conference Proceedings
Preliminary optical design for the TMT mid-infrared adaptive optics system and echelle spectrograph [6269-150]
SPIE - The International Society of Optical Engineering |
6
Conference Proceedings
Design tradeoffs for a high spectral resolution mid-infrared echelle spectrograph on the Thirty-Meter Telescope [6269-145]
SPIE - The International Society of Optical Engineering |
12
Conference Proceedings
Performance characteristics of the new Keck Observatory echelle spectrograph and imager
SPIE - The International Society for Optical Engineering |