CW laser induced deep level defects in virgin silicon
- Author(s):
- Chantre, A. ( CNET/CNS - BP )
- Kechouane, M. ( CNET/CNS - BP )
- Bois, D. ( CNET/CNS - BP )
- Publication title:
- Laser and electron-beam interactions with solids : proceedings of the Materials Research Society Annual Meeting, November 1981, Boston Park Plaza Hotel, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposia proceedings
- Ser. no.:
- 4
- Pub. Year:
- 1982
- Page(from):
- 325
- Page(to):
- 330
- Pub. info.:
- New York: North Holland
- ISSN:
- 02729172
- ISBN:
- 9780444006936 [0444006931]
- Language:
- English
- Call no.:
- M23500/4
- Type:
- Conference Proceedings
Similar Items:
North-Holland |
MRS - Materials Research Society |
2
Conference Proceedings
PULSED ELECTRON BEAM ANNEALING INDUCED DEEP LEVEL DEFECTS IN VIRGIN SILICON
North-Holland |
Electrochemical Society |
Materials Research Society |
9
Conference Proceedings
Fast-ion-induced defects in silicon studied by deep level transient spectroscopy
Kluwer Academic Publishers |
4
Conference Proceedings
A STUDY OF ELECTRICALLY ACTIVE DEFECTS INDUCED BY PULSED-ELECTRON-BEAM ANNEALING IN (100) N-TYPE VIRGIN SILICON
Materials Research Society |
10
Conference Proceedings
Study of the crystalline to amorphous silicon boundary following laser induced solid phase epitaxy
North Holland |
5
Conference Proceedings
DEFECT STATES INDUCED BY RAPID THERMAL ANNEALING IN VIRGIN OR IMPLANTED CZOCHRALSKY-GROWN SILICON
Materials Research Society |
Materials Research Society |
Trans Tech Publications |
Trans Tech Publications |