Terrenoire M., Tounissoux D.
D. Reidel
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J. Chappelow, S. Viswanath, J. Monaco, M. Rosen, J. Tomaszewski
Society of Photo-optical Instrumentation Engineers
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Terrenoire M., Tounissoux D.
Noordhoff International Publishing
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Yao,D., Azimi-Sadjadi,M.R., Li,D., Dobeck,G.J.
SPIE - The International Society for Optical Engineering
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Terrenoire M.
Noordhoff International Publishing
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Santos,R., Ohashi,T., Yoshida,T., Ejima,T.
SPIE-The International Society for Optical Engineering
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Azimi-Sadjadi,M.R., Yao,D., Dobeck,G.J.
SPIE - The International Society for Optical Engineering
|
Borghys, D., Shimoni, M., Perneel, C.
SPIE - The International Society of Optical Engineering
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Moser, G., Serpico, S. B., Martino, M. De, Coppolino, D.
SPIE - The International Society of Optical Engineering
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Nasri, M., Aboutni, R., Hitmy, M., Charif, H.N., Barboucha, M.
SPIE-The International Society for Optical Engineering
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Bashar, M.K., Ohnishi, N., Shevgaonkar, R.K.
SPIE-The International Society for Optical Engineering
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Mayavaram, R., Reddy, M., Stewart, D., Tolle, J.
Society of Plastics Engineers, Inc. (SPE)
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