A Rietveld Profile Analysis Treatment of Line-Broadening in KalF4 layered compound

A Rietveld Profile Analysis Treatment of Line-Broadening in KalF4 layered compound

Author(s):: GIBAUD A.
Publication title:: Chemical crystallography with pulsed neutrons and synchrotron X-rays
Title of ser.:: NATO ASI series. Series C, Mathematical and physical sciences
Ser. no.:: 221
Pub. Year:: 1988
Page(from):: 592
Page(to):: 592
Pages:: 1
Pub. info.:: Dordrecht: D. Reidel
ISSN:: 02582023
ISBN:: 9789027726315 [9027726310]
Language:: English
Call no.:: N11480/221
Type:: Conference Proceedings

Details

TDL ID:	ZA00018650
Series ID:	PA00000016
Conf. info. (Name):	NATO Advanced Study Institute on Chemical Crystallography with Pulsed Neutrons and Synchrotron X-rays
Conf. info. (Number):	1987
Conf. info. (Venue):	Alvor, Algarve, Portugal
Conf. info. (Date):	1987.03.17-1987.03.27

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