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Self-mixing interferometry for distance and displacement measurement by Fourier transform method

Author(s):
Publication title:
Laser diodes and leds in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-25 January 2000, San Jose, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3945
Pub. Year:
2000
Page(from):
193
Page(to):
201
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819435620 [0819435627]
Language:
English
Call no.:
P63600/3945
Type:
Conference Proceedings

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