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High-spectral-purity VCSELs for spectroscopy and sensors

Author(s):
Zappe,H.P. ( Ctr Suisse d'Electronique et de Microtechnique )
Sopra,F.M.di
Gauggel,H.-P.
Gulden,K.H.
Hovel,R.
Moser,M.
1 more
Publication title:
Laser diodes and leds in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-25 January 2000, San Jose, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3945
Pub. Year:
2000
Page(from):
106
Page(to):
116
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819435620 [0819435627]
Language:
English
Call no.:
P63600/3945
Type:
Conference Proceedings

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