Blank Cover Image

Accuracy enhancement of point triangulation probes for linear displacement measurement

Author(s):
Publication title:
Laser diodes and leds in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-25 January 2000, San Jose, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3945
Pub. Year:
2000
Page(from):
88
Page(to):
95
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819435620 [0819435627]
Language:
English
Call no.:
P63600/3945
Type:
Conference Proceedings

Similar Items:

Oh,S.B., Kim,K.-C., Kim,S.H., Kwak,Y.K.

SPIE-The International Society for Optical Engineering

Bae,E.W., Kim,J.-A., Kim,S.H., Kwak,Y.K.

SPIE-The International Society for Optical Engineering

Kim,K.-C., Oh,S.B., Kim,S.H., Kwak,Y.K.

SPIE-The International Society for Optical Engineering

Kim, J. W., Kim, J. -A, Kong, C. -S., Eom, T. B.

SPIE - The International Society of Optical Engineering

Kim,J.-A., Kim,K.-C., Bae,E.W., Kim,S., Kwak,Y.K.

SPIE - The International Society for Optical Engineering

C.H. Han, Y.K. Ryu, C.S. Oh, B.W. Choi

Trans Tech Publications

Song,J.-H., Kim,K.-C., Kim,S.-H., Kwak,Y.K.

SPIE - The International Society for Optical Engineering

S.K. Kim, Y.I. Kim, B.C. Lee, S.W. Kang, B.M. Kang, P.J. Kwak, J.H. Ahn

Trans Tech Publications

Song,J.S., Kim,B.J., Jo,J.H., Chang,S., Yuk,K.C.

SPIE-The International Society for Optical Engineering

Jung, M. R., Kwak, E. A., Oh, H.-K., Shim, S.-B., Choi, N.-R., Kim, J.-S.

SPIE - The International Society of Optical Engineering

Ko, W.S., Oh, S.B., Kim, S.H., Kwak, Y.K.

SPIE - The International Society of Optical Engineering

Kwon, I.-B., Yu, J.-A., Kim, C.-Y., Seo, D.-C., Kim, S. K., Jo, J.-H.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12