Blank Cover Image

Spectroscopic studies of asphaltenes

Author(s):
Publication title:
Rough surface scattering and contamination : 21-23 July 1999, Denver, Colorado
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3784
Pub. Year:
1999
Page(from):
393
Page(to):
400
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819432704 [0819432709]
Language:
English
Call no.:
P63600/3784
Type:
Conference Proceedings

Similar Items:

Cutierrez,H., Fernandez,A., Goncalves,S., Castillo,J.A., Hung,J.

SPIE - The International Society for Optical Engineering

Hung, J., Castillo, J.

SPIE - The International Society of Optical Engineering

Hung, J., Castillo, J.A., Goncalves Abreu, S., Fernandez, A.

SPIE - The International Society of Optical Engineering

Blanco, A., Mina, N., Castro, M. E., Castillo-Chara, J., Hernandez-Rivera, S. P.

SPIE - The International Society of Optical Engineering

Goncalves Abreu, S., Castillo, J.A., Fernandez, A., Acevedo, S.

SPIE - The International Society of Optical Engineering

Chabrillat, S., Kaufmann, H.J., Hill, J., Mueller, A.A., Merz, B., Ectler, H.

SPIE-The International Society for Optical Engineering

Castillo,J.A., Hung,J., Fernandez,A., Mujica,V.

SPIE - The International Society for Optical Engineering

Brodyanski, A., Medvedev, S., Minenko, M., Jodl, H.J.

Kluwer Academic Publishers

Hung, J., Castillo, J. A., Reyes, A.

SPIE - The International Society of Optical Engineering

Minami,N., Kazaoui,S., Wen,C., Byrne,H.J.

SPIE-The International Society for Optical Engineering

J. Castillo, H. Gutierrez, Y. Vitta, M. Martinez, A. Fernandez

Society of Photo-optical Instrumentation Engineers

Hung, J., Castillo, J.A., Marcano, A.A.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12