Polarization of light scattered by spheres on a dielectric film
- Author(s):
- Sung,L. ( National Institute of Standards and Technology and Univ.of Maryland/College Park )
- Mulholland,G.W.
- Germer,T.A.
- Publication title:
- Rough surface scattering and contamination : 21-23 July 1999, Denver, Colorado
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3784
- Pub. Year:
- 1999
- Page(from):
- 296
- Page(to):
- 303
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819432704 [0819432709]
- Language:
- English
- Call no.:
- P63600/3784
- Type:
- Conference Proceedings
Similar Items:
SPIE - The International Society for Optical Engineering |
7
Conference Proceedings
Application of bidirectional ellipsometry to the characterization of roughness and defects in dielectric layers
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
9
Conference Proceedings
Polarization measurements of the light scattered by dielectric randomly rough isotropic surfaces
SPIE |
SPIE - The International Society of Optical Engineering |
10
Conference Proceedings
Measurement of ultrasonically modulated scattered light for imaging in turbid media
Society of Photo-optical Instrumentation Engineers |
5
Conference Proceedings
Wavelength dependence of the light scattered from a dielectric film deposited on a metal substrate
SPIE - The International Society for Optical Engineering |
11
Conference Proceedings
Polarized light-scattering measurements of polished and etched steel surfaces
SPIE - The International Society for Optical Engineering |
6
Conference Proceedings
Characterizing surface roughness of thin films by polarized light scattering
SPIE - The International Society of Optical Engineering |
12
Conference Proceedings
Polarization of out-of-plane optical scatter from SiO2 films grown on photolithographically-generated microrough silicon
SPIE |