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UV detective quantum efficiency measurements

Author(s):
Joseph,C.L. ( Rutgers Univ. )  
Publication title:
Ultraviolet and x-ray detection, spectroscopy and polarimetry III : 19-20 July 1999, Denver, Colorado
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3764
Pub. Year:
1999
Page(from):
246
Page(to):
253
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819432506 [0819432504]
Language:
English
Call no.:
P63600/3764
Type:
Conference Proceedings

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