Theory and measurement of bidirectional reflectance for signature analysis

Theory and measurement of bidirectional reflectance for signature analysis

Author(s):

Publication title:

Targets and backgrounds : characterization and representation V : 5-7 April 1999, Orlando, Florida

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3699

Pub. Year:

1999

Page(from):

2

Page(to):

15

Pub. info.:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819431738 [0819431737]

Language:

English

Call no.:

P63600/3699

Type:

Conference Proceedings

Details

TDL ID:	ZA00018543
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Targets and Backgrounds
Conf. info. (Number):	1999 : 5th
Conf. info. (Venue):	Orlando, FL, USA
Conf. info. (Date):	1999.04.05-1999.04.07

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