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Improved measurement precision through continuous optical focusing on optoelectronic detection devices

Author(s):
Publication title:
SIOEL '99 : Sixth Symposium on Optoelectronics : 22-24 September 1999, Bucharest, Romania
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4068
Pub. Year:
2000
Page(from):
330
Page(to):
335
Pub. info.:
Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437051 [0819437050]
Language:
English
Call no.:
P63600/4068
Type:
Conference Proceedings

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