Kanervo, J.M., Krause, A.O.I.
Elsevier
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Krause L. J., Orel E. A., Lengsfield H. B., Kulander C. K.
Plenum Press
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Airaksinen, S.M.K., Kanervo, J.M., Krause, A.O.I.
Elsevier
|
Krause, S.J., Wilson, S.R., Gregory, R.B., Paulson, W.M., Leavitt, J.A., McIntyre Jr., L.C., Seerveld, J.L., Stoss, P.
Materials Research Society
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Vainshtein, S., Kostamovaara, J., Backman, S., Sverdlov, M., Shestak, L.
SPIE - The International Society of Optical Engineering
|
Sowerby, B., Becker, S. J.
Elsevier
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Miller, M. L., Siddall, J. H., Delgass, W. N.
American Institute of Chemical Engineers
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Fleischmann M., Pons S., Daschbach J.
Kluwer Academic Publishers
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J.L. Wang, J. Hou, T. Jiang, Y.J. He, Y.D. Liang
Trans Tech Publications
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Tong, Penger, Carvalho, B. L., Huang, J. S., Fetters, L. J.
American Chemical Society
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Krause, S. J., Wilson, S. R., Paulson, W. M., Gregory, R. B.
Materials Research Society
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J.M. Halpern, S. Xie, J.L. Schreiber, H.B. Martin
Electrochemical Society
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