An Important Failure Mechanism in MOCVD (Ba,Sr)TiO3 Thin Films: Resistance Degradation
- Author(s):
Basceri, C. Lash, S. E. Parker, C. B. Streiffer, S. K. Kingon, A. I. Grossmann, M. Hoffmann, S. Schumacher, M. Waser, R. Bilodeau, S. Carl, R. Buskirk, P. C. Van Summerfelt, S. R. - Publication title:
- Ferroelectric thin films VI : symposium held November 30-December 4, 1997, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 493
- Pub. Year:
- 1998
- Page(from):
- 9
- Pub. info.:
- Pittsburgh, Pa.: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558993983 [1558993983]
- Language:
- English
- Call no.:
- M23500/493
- Type:
- Conference Proceedings
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