Blank Cover Image

Measurements of Dielectric Properties for Intense Heating Applications

Author(s):
Publication title:
Microwave processing of materials V : symposium held April 8-12, 1996, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
430
Pub. Year:
1996
Page(from):
231
Pub. info.:
Pittsburgh,, PA: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558993334 [1558993339]
Language:
English
Call no.:
M23500/430
Type:
Conference Proceedings

Similar Items:

Paz, O., Borrego, J. M.

Materials Research Society

S. Dill, M. Peichl, H. Suess

SPIE - The International Society of Optical Engineering

Pletschen, W., Bachem, K.H., Chertouk, M., Buerkner, S., Braunstein, J.

Electrochemical Society

Das-Gupta, D.K., Abdullah, M.J.

Materials Research Society

Venkatasubramanian, R., Borrego, J.M., Ghandi, S.K.

Materials Research Society

Miyakoshi,T., Tanaka,K.A., Kodama,R., Mima,K., Yamanaka,T., Kitagawa,Y., Fujita,H., Miyanaga,N., Norimatsu,T., …

SPIE - The International Society for Optical Engineering

Venkatasubramanian, R., Lee, W. I., Ghanhdi, S. K., Borrego, J. M.

Materials Research Society

Bothra, S., Venkatasubramanian, R., Gandhi, S. K., Borrego, J. M.

Materials Research Society

Ferris,K.F., Exarhos,G.J., Risser,S.M.

SPIE-The International Society for Optical Engineering

Paz, O., Bhat, K.N., Borrego, J.M.

North-Holland

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12