Simulation of Uniformity and Lifetime Effects in Collimated Sputtering
- Author(s):
Tait, R. N. Dew, S. K. Tsai, W. Hodul, D. Brett, M. J. Smy, T. - Publication title:
- Modeling and simulation of thin-film processing : symposium held April 17-20, 1995, San Francisco, California, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 389
- Pub. Year:
- 1995
- Page(from):
- 373
- Pub. info.:
- Pittsburgh: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558992924 [1558992928]
- Language:
- English
- Call no.:
- M23500/389
- Type:
- Conference Proceedings
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