Blank Cover Image

Surface thermal lensing technique:a novel tool for studying contamination effects on optical components

Author(s):
Publication title:
Optical System Contamination V, and Stray Light and System Optimization
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2864
Pub. Year:
1996
Vol.:
PartA
Page(from):
286
Page(to):
292
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819422521 [0819422525]
Language:
English
Call no.:
P63600/2864
Type:
Conference Proceedings

Similar Items:

Chow,R., Taylor,J.R., Wu,Z., Krupka,R., Yang,T.

SPIE-The International Society for Optical Engineering

Guehenneux, G. F., Veillerot, M., Tovena, I., Bouchut, Ph. R., Deirive, L.

SPIE - The International Society of Optical Engineering

Krupka,R., Giesen,A.

SPIE-The International Society for Optical Engineering

Z.L. Wu, P.K. Kuo, R.L. Thomas, Z.X. Fan

Society of Photo-optical Instrumentation Engineers

Krupka,R., Giesen,A.

SPIE-The International Society for Optical Engineering

R. Krupka, K. Jasper, A. Giesen

Society of Photo-optical Instrumentation Engineers

Krupka, R.

SPIE - The International Society of Optical Engineering

Graf,T., Weber,R., Weber,H.-P.

SPIE - The International Society for Optical Engineering

M. Liu, B. Li, Y. Wang, H. Hao

Society of Photo-optical Instrumentation Engineers

Wu,Z.L., Feit,M.D., Kozlowski,M.R., Natoli,J.Y., Rubenchik,A.M., Sheehan,L.M., Yan,M.

SPIE - The International Society for Optical Engineering

Wu,Z.L., Feit,M.D., Kozlowski,M.R., Rubenchik,A.M., Sheehan,L.M.

SPIE - The International Society for Optical Engineering

Yan,M., Oberhelman,S., Siekhaus,W.J., Wu,Z.L., Sheehan,L.M., Kozlowski,M.R.

SPIE - The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12