Blank Cover Image

Quick-scanning TDL spectrometry for atmospheric trace gas monitoring with antiscintillation performance

Author(s):
Publication title:
Application of tunable diode and other infrared sources for atmospheric studies and industrial process monitoring : 8-9 August 1996, Denver, Colorado
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2834
Pub. Year:
1996
Page(from):
142
Page(to):
147
Pub. info.:
Bellingham, WA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819422224 [0819422223]
Language:
English
Call no.:
P63600/2834
Type:
Conference Proceedings

Similar Items:

Kagawa,N., Wada,O., Koga,R.

SPIE-The International Society for Optical Engineering

B. Mijling, R. J. van der A, I. De Smedt

ESA Communications

Kagawa,N., Wada,O., Koga,R.

SPIE - The International Society for Optical Engineering

M. Kagawa, H. Murai

Society of Photo-optical Instrumentation Engineers

Kagawa,N., Wada,O., Koga,R.

SPIE-The International Society for Optical Engineering

Miyamura, N., Kawashima, T., Tanii, J., Kuze, A., Tange, Y., Kondo, K., Soucy, M.-A.

SPIE-The International Society for Optical Engineering

Wei,H., Koga,R., Iokibe,K., Wada,O., Toyota,Y., Kagawa,N.

SPIE-The International Society for Optical Engineering

Barrett, Peter, Copeland, Thomas R.

American Chemical Society

M. Wang, O. Wada, R. Koga

Society of Photo-optical Instrumentation Engineers

F.J.M. Harren, H.S.M. de Vries, N. Dam, R. van Haeren, J. Reuss

Society of Photo-optical Instrumentation Engineers

Wang, W.-C., Sze, N.Dak, Molnar, G., KO, M., Goldenberg, S.

Kluwer Academic Publishers

Zhu, M., Wen, W., Ding, X., Wang, P., Yao, J.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12