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Evaluation of the total dose and single event upset effects on JPEG/DPCM LSI device and 16Mb-DRAM for space application

Author(s):
Publication title:
Missions to the sun : 8-9 August 1996, Denver, Colorado
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2804
Pub. Year:
1996
Page(from):
185
Page(to):
193
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819421920 [0819421928]
Language:
English
Call no.:
P63600/2804
Type:
Conference Proceedings

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