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Analysis of VCSEL degradation modes

Author(s):
Herrick,R.W. ( Univ.of California/Santa Barbara )
Cheng,Y.M.
Beck,J.M.
Petroff,P.M.
Scott,J.W.
Peters,M.G.
Robinson,G.D.
Coldren,L.A.
Morgan,R.A.
Hibbs-Brenner,M.K.
5 more
Publication title:
Fabrication, testing, and reliability of semiconductor lasers : 31 January-1 February, 1996, San Jose, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2683
Pub. Year:
1996
Page(from):
123
Page(to):
133
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819420572 [0819420573]
Language:
English
Call no.:
P63600/2683
Type:
Conference Proceedings

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