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Advanced epitaxial growth and device processing techniques for ultrahigh-speed(>40 GHz)directly modulated semiconductor lasers

Author(s):
Ralston,J.D. ( SDL,Inc )
Larkins,E.C.
Eisele,K.
Weisser,S.
Burkner,S.
Schonfelder,A.
Daleiden,J.
Czotscher,K.
Esquivias,I.
Fleissner,J.
Sah,R.E.
Maier,M.
Benz,W.
Rosenzweig,J.
9 more
Publication title:
Fabrication, testing, and reliability of semiconductor lasers : 31 January-1 February, 1996, San Jose, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2683
Pub. Year:
1996
Page(from):
30
Page(to):
41
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819420572 [0819420573]
Language:
English
Call no.:
P63600/2683
Type:
Conference Proceedings

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