Kindler, J., Geidel, E., Krause, K., Mills, G., Forster, H.
Elsevier
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Forster, H., Witten, U.
Elsevier
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Wakabayashi, F., Kondo, J., Domen, K., Hirose, C.
Elsevier
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Engelhardt, G., Hunger, M., Koller, H., Weitkamp, J.
Elsevier
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Bauer, F., Ernst, H., Geidel, E., Peuker, Ch., Pilz, W.
Elsevier
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Hatje, U., Hagelstein, M., Forster, H.
Elsevier
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Li, Y., Han, H., Yang, J., Bai, F., Mo, Y., Han, M., Xu, J., Wu, J., Zhu, D.
Electrochemical Society
|
Gutsze, A., Plato, M., Witzel, F., Karge, H. G.
Elsevier
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Jakobsen, R. J., Wasacz, F. M.
American Chemical Society
|
Conard,S.J., Redman,K.W., Barkhouser,R.H., Johnson,J.A.
SPIE - The International Society for Optical Engineering
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Bockris, J. O'M., Chandrasekaran, K.
American Chemical Society
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K. Wolfrum, J. Löbau, A. Laubereau
Society of Photo-optical Instrumentation Engineers
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