Costello, C. E., Wilson, B. W., Biemann, K., Reinhold, V. N.
American Chemical Society
|
Evans, Keith R.
MRS - Materials Research Society
|
John, G. A. St., Buttrill, S. E., Jr., Anbar, M.
American Chemical Society
|
Holland, J. F., Allison, J., Watson, J. T., Enke, C. G.
American Chemical Society
|
Chen,C.H.W., Taranenko,N.I., Zhu,Y.F., Allman,S.L., Tang,K., Matteson,K.J., Chang,L.Y., Chung,C.N., Martin,S., Haff,L.
SPIE-The International Society for Optical Engineering
|
Overberg A., Hassenburger A., Hillenkamp F.
Kluwer Academic Publishers
|
Brown, R. S., Wilkins, C. L.
American Chemical Society
|
C.H. Winston Chen, N.I. Taranenko, K. Tang, S.L. Allman
Society of Photo-optical Instrumentation Engineers
|
Chen,C.H., Golovlev,V.V., Taranenko,N.I., Allman,S.L., Isola,N.R., Potter,N.T., Matteson,K.J., Chang,L.Y.
SPIE - The International Society for Optical Engineering
|
McLafferty, F. W., Venkataraghavan, R.
American Chemical Society
|
Feistner J. G., Barofsky F. D., Evans J. C., Faull F. K., Roepstorff P.
Plenum Press
|
Hillenkamp F., Ehring H.
Kluwer Academic Publishers
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