Depth Profiling of Defects in Argon Irradiated Silicon Using Positron Beam Facility at Kalpakkam
- Author(s):
- Publication title:
- Positron annihilation, ICPA-11 : Proceedings of the 11th International Conference on Positron Annihilation, Kansas City, Missouri, USA, May 1997
- Title of ser.:
- Materials science forum
- Ser. no.:
- 255-257
- Pub. Year:
- 1997
- Page(from):
- 650
- Page(to):
- 652
- Pub. info.:
- Zuerich, Switzerland: Trans Tech Publications
- ISSN:
- 02555476
- ISBN:
- 9780878497799 [087849779x]
- Language:
- English
- Call no.:
- M23650
- Type:
- Conference Proceedings
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