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Defect Profiling with Low Energy Positrons of Nitrogen Implanted Silicon

Author(s):
Werf,D.P.van der
Saleh,A.S.
Towner,A.
Nathwani,M.
Taylor,J.
Rice-Evans,P.C.
Bull,S.J.
2 more
Publication title:
Positron annihilation, ICPA-11 : Proceedings of the 11th International Conference on Positron Annihilation, Kansas City, Missouri, USA, May 1997
Title of ser.:
Materials science forum
Ser. no.:
255-257
Pub. Year:
1997
Page(from):
500
Page(to):
502
Pub. info.:
Zuerich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497799 [087849779x]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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