Local Mechanical Properties in Thin Aluminium Layers on Silicon Substrates Calculated from Measured Grain Orientations

Local Mechanical Properties in Thin Aluminium Layers on Silicon Substrates Calculated from Measured Grain Orientations

Author(s):

Publication title:

ICOTOM-10 : proceedings of the 10th International Conference on Textures of Materials, Clausthal, Germany, 20-24 September 1993

Title of ser.:

Materials science forum

Ser. no.:

157-162

Pub. Year:

1994

Vol.:

Part2

Page(from):

1571

Page(to):

1576

Pub. info.:

Aedermannsdorf, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878496815 [0878496815]

Language:

English

Call no.:

M23650

Type:

Conference Proceedings

Details

TDL ID:	ZA00018360
Series ID:	PA00000012
Conf. info. (Name):	International Conference on Textures of Materials : ICOTOM
Conf. info. (Number):	10th
Conf. info. (Venue):	Clausthal, Germany
Conf. info. (Date):	1993.09.20-1993.09.24

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