Calibration and nonuniformity correction of MICOM's diode-laser-based infrared scene projector

Calibration and nonuniformity correction of MICOM's diode-laser-based infrared scene projector

Author(s):

Beasley,D.B. ( Optical Sciences Corp. )
Cooper,J.B. ( Optical Sciences Corp. )
Saylor,D.A. ( Optical Sciences Corp. )
Buford,J.A.,Jr. ( U.S. Army Missile Command )

Publication title:

Technologies for synthetic environments : hardware-in-the-loop testing II : 21-23 April 1997, Orlando, Florida

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3084

Pub. Year:

1997

Page(from):

91

Page(to):

101

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819424990 [0819424994]

Language:

English

Call no.:

P63600/3084

Type:

Conference Proceedings

Details

TDL ID:	ZA00018340
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Technologies for Synthetic Environments
Conf. info. (Number):	1997 : 2nd
Conf. info. (Venue):	Orlando, FL, USA
Conf. info. (Date):	1997.04.21-1997.04.23

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