Spectral fitting in AXAF calibration detectors

Spectral fitting in AXAF calibration detectors

Author(s):

Edgar,R.J. ( Smithsonian Astrophysical Observatory )
Tsiang,E.Y. ( Smithsonian Astrophysical Observatory )
Tennant,A.F. ( NASA Marshall Space Flight Ctr. )
Vitek,S.A. ( Smithsonian Astrophysical Observatory )
Swartz,D.A. ( Universities' Space Research Association )

Publication title:

Grazing incidence and multilayer X-ray optical systems : 27-29 July 1997, San Diego, California

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3113

Pub. Year:

1997

Page(from):

124

Page(to):

131

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819425355 [0819425354]

Language:

English

Call no.:

P63600/3113

Type:

Conference Proceedings

Details

TDL ID:	ZA00018337
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Grazing Incidence and Multilayer X-Ray Optical Systems
Conf. info. (Number):	1997
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	1997.07.27-1997.07.29

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