Progress toward submicron hard x-ray imaging using elliptically bent mirrors

Progress toward submicron hard x-ray imaging using elliptically bent mirrors

Author(s):

MacDowell,A.A. ( Lawrence Berkeley National Lab. )

Celestre,R. ( Lawrence Berkeley National Lab. )

Chang,C.-H. ( Lawrence Berkeley National Lab. )

Franck,K. ( Lawrence Berkeley National Lab. )

Howells,M.R. ( Lawrence Berkeley National Lab. )

Locklin,S.C. ( Lawrence Berkeley National Lab. )

Padmore,H.A. ( Lawrence Berkeley National Lab. )

Patel,J.R. ( Lawrence Berkeley National Lab. )

Sandler,R. ( Lawrence Berkeley National Lab. )

4 more

Publication title:

Materials, manufacturing, and measurement for synchrotron radiation mirrors : 30-31 July 1997, San Diego, California

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3152

Pub. Year:

1997

Page(from):

126

Page(to):

133

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819425744 [0819425745]

Language:

English

Call no.:

P63600/3152

Type:

Conference Proceedings

Details

TDL ID:	ZA00018333
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Materials, Manufacturing, and Measurement for Synchrotron Radiation Mirrors
Conf. info. (Number):	1997
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	1997.07.30-1997.07.31

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