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New method of measuring CCD device photoresponse nonuniformity

Author(s):
Wang,F. ( Ordnance Engineering College (China) )
Shen,X. ( Ordnance Engineering College (China) )
Chen,W. ( Ordnance Engineering College (China) )
Sun,X. ( Ordnance Engineering College (China) )
Dong,W. ( Ordnance Engineering College (China) )
Zhou,B. ( Ordnance Engineering College (China) )
1 more
Publication title:
Detectors, focal plane arrays, and imaging devices II : 18-19 September 1998, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3553
Pub. Year:
1998
Page(from):
295
Page(to):
296
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819430144 [0819430145]
Language:
English
Call no.:
P63600/3553
Type:
Conference Proceedings

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