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Effects of different surface treatments of CZT samples on the values of DCRC FWHM of x-ray diffraction

Author(s):
Mo,Y. ( Kunming Institute of Physics (China) )
Huang,H. ( Kunming Institute of Physics (China) )
Qin,J. ( Kunming Institute of Physics (China) )
Chen,H. ( Kunming Institute of Physics (China) )
Wu,G. ( Kunming Institute of Physics (China) )
Liu,C. ( Kunming Institute of Physics (China) )
Li,D. ( Yunnan Univ.(China) )
2 more
Publication title:
Detectors, focal plane arrays, and imaging devices II : 18-19 September 1998, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3553
Pub. Year:
1998
Page(from):
61
Page(to):
65
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819430144 [0819430145]
Language:
English
Call no.:
P63600/3553
Type:
Conference Proceedings

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